Why an M-2000? Because of advanced features such as
Advanced Ellipsometer TechnologyFirst of all the M-2000 utilizes our patented RCE (rotating compensator ellipsometer) technology to achieve high accuracy and precision.
Fast Spectral DetectionAnother feature of the RCE design is compatible with advanced, proven CCD detection to measure ALL wavelengths simultaneously.
Wide Spectral RangeAlso users can collect over 700 wavelengths from the ultraviolet to the near infrared – all simultaneously.
Flexible System IntegrationWith modular optical design, the M-2000 is suited for direct attachment to your process chamber or configured on any of our table-top bases.
AccuracyAdvanced design ensures accurate ellipsometry measurements for any sample.
Product Category: Ellipsometry
Industry: Particle and surface science
Supplier: J A Woollam
Automated Angle (Horizontal) M-2000
|The horizontal M-2000 system offers wide range of options like large area mapping, liquid cells, and heat stages.Ideal for general use and large samples.|
Automated Angle (Vertical) M-20000
|The vertical M-2000 system offers wide angle range and flexibility.
Independent control of sample and detector angle for
diverse reflection or transmission measurements.
Fixed Angle M-2000
|Translator Size: 50×50 mm XY|
|The smallest M-2000 spot size available (25 by 60 microns) for demanding feature sizes.|
|Ellipsometer Configuration||Dual RCE|
|Number of Wavelengths||D
|Angles of Incidence||45°-90° (Automated Angle Base)20°-90° (Vertical Automated Angle Base)
~65° (Focused Base)
65° (Fixed Angle Base)
65° (Test Base)
|Data Acquisition Rate
|0.05 seconds (2-5 seconds is Typical)|
|Max substrate thickness||18mm|
|Power||100/240 VAC, 47-63Hz, <1 Amp|
Dimensions vary depending on options. More details coming soon.