RC2The RC2® design builds on 25 years of Ellipsometer experience. It combines the best features of previous Ellipsometer models. This includes innovative new technology such as dual rotating compensators, achromatic compensator design, advanced light source and next-generation spectrometer design. Because of this the RC2 Ellipsometer is a near-universal solution for the diverse applications of spectroscopic ellipsometry.
Why an RC2? Because of the advantages such as.
Advanced Measurement CapabilitiesThe RC2 is the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. AS a result Mueller matrix SE allows characterization of the most advanced samples and nanostructures.
Best Measurement AccuracyAdvanced measurement capabilities allow the best accuracy from fast CCD-based ellipsometry.
Dual Rotating CompensatorsSynchronous rotation of two compensators provides high accuracy, high speed, and most noteworthy the complete Mueller-matrix measurements.
Achromatic Compensator Design*New achromatic compensator design with optimized performance over a wide spectral range. *patent pending
Wide Spectral RangeCollect over 1000 wavelengths from the ultraviolet to the near infrared – all simultaneously. Consequently you achieve speed and range.
Fast Measurement SpeedSynchronous operation of both compensators allows highly accurate data without waiting to “zone-average” over optical elements. AS such you collect the entire spectrum (over 1000 wavelengths) simultaneously in a fraction of a second.
Advanced “Dual” Light SourceDual light source for extended spectral range with computer control of beam intensity. Automatically optimize signal on any sample (low or high reflection). As a result the RC is the most advanced fast scanning Ellipsometer available
Product Category: Ellipsometry
Industry: Particle and surface science
Supplier: J A Woollam
Traditional ellipsometry measurements are ideal for standard thin film characterization. However, more advanced measurements are required for anisotropic materials.
Generalized Ellipsometry collects six values compared to the standard two (Ψ, ∆). This additional information completely characterizes the cross-polarization of anisotropic samples.
Jones Matrix for Anisotropic Sample:
Generalized Ellipsometry Measures:
Variable Angle Generalized Ellipsometry was used to fully characterize the biaxial indices (nx ≠ ny ≠ nz) of the PEN substrate.
The RC2 can characterize the full Mueller-matrix of a sample. This advanced data type insures appropriate characterization of complex samples that are both anisotropic and depolarizing.
Mueller matrix for anisotropic, depolarizing sample:
Twisted nematic liquid crystal films introduce the complexity of an anisotropic film with a smoothly varying optical axis. With the thick liquid crystal layer sandwiched between glass substrates, the Mueller-matrix measurements insure the best measurement.
The complete Mueller-matrix was measured for a twisted liquid crystal. This enabled characterization of the optical axis twist and pre-tilt, and liquid crystal anisotropic refractive index.
Is automated mapping included?
The RC2 is highly customizable. We offer several options for automated mapping.
Is table included?
The table pictured is an optional feature convenient for containing computer and electronics.
Can the RC2 be used in situ?
Yes. Modular source and receiver can be attached to chamber.
Which software package is included?
What is the difference between M-2000 and RC2?
The M-2000 was the first widely-used high-speed ellipsometer. It has a long history of success in research and production, and it’s optical design includes a single rotating compensator. The RC2 is a newer design with many of the same great features combined with innovative new technology. Further, it has two rotating compensators, which allow measurement of the full Mueller-matrix.
|Ellipsometer Configuration||Dual RCE|
|Number of Wavelengths||D
|Angles of Incidence||45°-90° (Automated Angle Base)
20°-90° (Vertical Automated Angle Base)
~65° (Focused Base)
65° (Fixed Angle Base)
65° (Test Base)
|Data Acquisition Rate
|0.3 seconds (2-10 seconds is Typical)|
|Max substrate thickness||18mm|
|Power||100/240 VAC, 47-63Hz, <1 Amp|