Particle and surface science
MP-SPR Navi™ 400 KONTIO
Semi-automated and modular MP-SPR NaviTM 400 KONTIO is specially designed to measure cell adhesion and cell-based interactions in physiologically relevant conditions. The instrument is compatible with complex cell culture media and…
Find Out More
Tap Density
TAP-2SP density tester is designed for powder/granule tapping or tap density tests in compliance with USP, BP, and EP requirements. It is used in pharmaceutical and chemical engineering field. Features:…
Find Out More
IGAsorp DYNAMIC VAPOR SORPTION ANALYZER
FULLY AUTOMATED COMPACT BENCHTOP DVS ANALYZER, FOR FAST & ACCURATE SORPTION MEASUREMENTS BENEFITS OF IGASORP Unrivalled performance and total baseline stability Proven reliability supported by 3 year warranty Fast and…
Find Out More
XEMIS-002
NEXT GENERATION PURE GAS AND VAPOR SORPTION ANALYZER HIGH RESOLUTION GAS & VAPOR SORPTION ANALYZER, WITH NEXT GENERATION MICROBALANCE DESIGN FOR HIGH PRESSURE & CORROSIVE CAPABILITY BENEFITS OF XEMIS Widest…
Find Out More
IMI-HTP
HIGH ACCURACY HYDROGEN STORAGE ANALYZER MANOMETRIC HYDROGEN SORPTION ANALYZER, FOR INVESTIGATION OF NOVEL HYDROGEN STORAGE MATERIALS
Find Out More
XEMIS-001
NEXT GENERATION PURE GAS GRAVIMETRIC SORPTION ANALYZER ADVANCED GAS SORPTION ANALYZER, WITH NEXT GENERATION MICROBALANCE DESIGN FOR HIGH PRESSURE & CORROSIVE CAPABILITY
Find Out More
IGA-001
GRAVIMETRIC GAS SORPTION ANALYZER HIGH ACCURACY GRAVIMETRIC SORPTION ANALYZER, FOR PRECISE CHARACTERIZATION OF GAS SORPTION EQUILIBRIA & KINETICS
Find Out More
VUV-VASE Ellipsometer
The VUV-VASE® variable angle spectroscopic ellipsometer is the gold standard for optical characterization of lithography thin films. It measures wavelengths from vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to…
Find Out More
IR-VASE Mark II Ellipsometer
The IR-VASE® is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range from…
Find Out More
alpha-SE Ellipsometer
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have…
Find Out More