Particle and surface science
Capillary Flow Porometer
Model: iCFP-1100 / iCFP-1200 / iCFP-1500 iCFP is a new generation Porometer of Capillary Flow Porometer based on gas-liquid displacement method (ASTM-F316) Non-destructive nature of testing Fully automated & computer…
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Innova Ultra-Nano Porometer
Series: Innova UNP-1100 / Innova UNP-1200/ Innova UNP-1500 Innova Ultra-Nano Porometer (Innova-UNP) is a combination of Capillary Flow Porometer(gas-liquid method) that measure large pores of 500 um to 0.013 um…
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MP-SPR Navi™ 400 KONTIO
Semi-automated and modular MP-SPR NaviTM 400 KONTIO is specially designed to measure cell adhesion and cell-based interactions in physiologically relevant conditions. The instrument is compatible with complex cell culture media and…
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Tap Density
TAP-2SP density tester is designed for powder/granule tapping or tap density tests in compliance with USP, BP, and EP requirements. It is used in pharmaceutical and chemical engineering field. Features:…
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IGAsorp DYNAMIC VAPOR SORPTION ANALYZER
FULLY AUTOMATED COMPACT BENCHTOP DVS ANALYZER, FOR FAST & ACCURATE SORPTION MEASUREMENTS BENEFITS OF IGASORP Unrivalled performance and total baseline stability Proven reliability supported by 3 year warranty Fast and…
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XEMIS-002
NEXT GENERATION PURE GAS AND VAPOR SORPTION ANALYZER HIGH RESOLUTION GAS & VAPOR SORPTION ANALYZER, WITH NEXT GENERATION MICROBALANCE DESIGN FOR HIGH PRESSURE & CORROSIVE CAPABILITY BENEFITS OF XEMIS Widest…
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IMI-HTP
HIGH ACCURACY HYDROGEN STORAGE ANALYZER MANOMETRIC HYDROGEN SORPTION ANALYZER, FOR INVESTIGATION OF NOVEL HYDROGEN STORAGE MATERIALS
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XEMIS-001
NEXT GENERATION PURE GAS GRAVIMETRIC SORPTION ANALYZER ADVANCED GAS SORPTION ANALYZER, WITH NEXT GENERATION MICROBALANCE DESIGN FOR HIGH PRESSURE & CORROSIVE CAPABILITY
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IGA-001
GRAVIMETRIC GAS SORPTION ANALYZER HIGH ACCURACY GRAVIMETRIC SORPTION ANALYZER, FOR PRECISE CHARACTERIZATION OF GAS SORPTION EQUILIBRIA & KINETICS
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VUV-VASE Ellipsometer
The VUV-VASE® variable angle spectroscopic ellipsometer is the gold standard for optical characterization of lithography thin films. It measures wavelengths from vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to…
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