Particle and surface science
MP-SPR Navi™ 220A NAALI
Well plate automation for life sciences MP-SPR Navi™ 220A NAALI measures not only interactions providing premium quality data with PureKinetics™, but also measures conformational changes and layer properties.
Find Out More
MP-SPR Navi™ 210A VASA
6-sample automation not only for material characterization! Wider inner diameter of the flow-cell tubings and 6-sample automation makes MP-SPR Navi™ 210A VASA ideal for material characterization and nanoparticle research.
Find Out More
MP-SPR Navi™ 200 OTSO
Semi-automated and modular MP-SPR Navi™ 200 OTSO is our entry level MP-SPR system making it ideally suited for teaching and educational purposes. Open design is optimal when auxiliary instruments are to…
Find Out More
SZ Particle Size Analyser
A highly advanced particle size analyzer solves the mysteries of the nano-world. A single device particle size analyzer measures the three parameters that characterize nanoparticles: particle size analysis, zeta potential,…
Find Out More
LA960 Laser Particle Size Analyser
Laser Scattering Particle Size Distribution Analyzer The most high-end class accurate and reliable laser diffraction particle size analysis instrument HORIBA Partica LA-950V2 particle size analyser has been upgraded to the…
Find Out More
LA 350
HORIBA’s new LA-350 Laser Diffraction Particle Size Analyzer is the ideal combination of performance, price, and packaging. The LA-350 particle size analyser excels in applications as diverse as slurries, minerals,…
Find Out More
Foam Tester
The SITA FoamTester analyses the characteristics of foam testing surfactant-containing liquids easy, fast and precise with automated foam testing measuring sequences. • Fully automated Sita foam tester analysis •…
Find Out More
VASE
The VASE® is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral…
Find Out More
M2000
The M-2000® spectroscopic ellipsometer range is engineered to meet the diverse demands of thin film characterization customers. Because of an advanced optical design, wide spectral range, and fast data acquisition combine and as…
Find Out More- « Previous
- 1
- …
- 5
- 6
- 7